Tektronix will be showcasing a wide-range of optical test and measurement products at ECOC 2014 (Stand 495, Ground Floor), which takes place from 22-24.09.2014 in Cannes, France.
The Tektronix products on display will address a wide range of applications, from 40Gb/s stressed pattern generation for high speed datacom and telecom test, as well as multi-channel pattern generation and multi-channel BERT testing to coherent lightwave signal analysis and testing of the world's most complex components; visitors to the Tektronix stand will be able to get hands-on demonstrations and technical advice to help them solve their individual test and measurement challenges.
On hand will be the new AWG70000 Series Arbitrary Waveform Generator that offers the industry's best combination of high sample rate, long waveform memory and deep dynamic range.