Topics include reliability test, screening and failure root cause analysis.
3M Innovation showcase tour - Delegates will have an excusive opportunity to tour the new 3M Innovation showcase where latest developments and research will be on display in a novel interactive format.
Agenda
09:00 Registration
Welcome and Introduction - Patrick McNamee / Paul Jarvie, NMI
Thermal Management Principles and Applications - Abel Ebongue, 3M Power Electronics
Components for Harsh Environments - Laurence Mitchell, API Capacitors
Long Term Reliability of Silicon Carbide - Rob Coleman, TT Electronics / Roger Tall, Charcroft Electronics
Reliability Test for Extreme Remote Environments - Kees Revenberg, Maser Engineering
Harsh Environment Considerations in Automotive - Integration Leigh Murray, University of Warwick
15:00 Exclusive Tour - 3M new Innovation Centre
16:00 Closing remarks and event close.
Free to attend - follow this link to register