Delights & Disasters of RF Measurements
Delights & Disasters of RF Measurements
The demands on wireless systems are getting ever greater, at the same time as they are becoming ever more complex. This places more stringent requirements on the RF measurements to verify performance and resolve any issues before manufacture.
If you make RF measurements, design, install or use RF systems, then you need to attend this event to get an invaluable update on the latest advances in techniques and equipment available to help you.
This in person event will feature an extended networking lunch over displays so delegates will have the opportunity to review the latest quipment from the sector. Kindly hosted and sponsored by Qualcomm Technologies International at their Cambridge office we have limited delegate places for this popular SIG event, so early registration is essential.
Speakers include:
- Clive Barnett - Solution Engineer, Keysight Technologies
- Jonathan Borrill - CTO, Anritsu
- Kauser Chaudhry - Principal RF Engineer and RF Team Lead, CSA Catapult
- Sam Darwish - 5G Sales Director, VIAVI Solutions
- Geoff Hilton - Senior Lecturer in Electrical & Electronic Engineering, University of Bristol (Communication Systems & Networks Research Group)
- Jamie Lunn - Vector Network Analyser Product Manager, Rohde and Schwarz
- Tim Newton - CTO, RFcreations